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Thursday, February 20 • 8:00am - 8:30am
Advances in Focused Ion Beam Technology for the Characterization and Analysis of Polymer, Ceramic, and Metallic Coatings - Thermo Fisher

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Scanning electron microscopy (SEM) and focused ion beam (FIB) techniques, together commonly known as a DualBeam, have long been a critical component for the analysis of polymer, ceramic, and metallic coatings.  Recent advances in ion beam technology have opened the practical application space to the processing and data collection from larger areas and greater volumes.  Due to throughput limitations, the common site-specific cross-sections were no larger than 50 - 100 µm; volumes for three-dimensional (3D) analysis measured in the tens of cubic microns.  The development and incorporation of the plasma focused ion beam (PFIB) has increased this by an order of magnitude, making up to 1 mm site-specific cross-sections a common feature.  Analytical volumes, including 3D imaging, 3D energy dispersive X-ray spectroscopy, and 3D electron backscatter diffraction, have also expanded significantly.  These greater areas and volumes have improved the analysis of large features and increased the statistical relevancy of DualBeam data, aiding decision-making based on information derived at the micro- and nanometer scales.  This paper will discuss the advances in PFIB technology and provide application examples of polymer, ceramic, and metallic coatings.

Speakers
RP

Rick Passey

SEM/DualBeam Product Marketing Engineer, Materials and Structural Analysis, Thermo Fisher Scientific
BiographyRick Passey is an SEM/DualBeam applications expert who has been with Thermo Fisher Scientific (formerly FEI) for 11 years. His experience covers a wide range of microscopes and techniques, from environmental SEM to the multi-ion source plasma FIB, 3D EDS/EBSD characterization... Read More →



Thursday February 20, 2020 8:00am - 8:30am
Rhythms Room I